P5
Magnetic interface properties of new materials with high spin polarization (Elmers)
In the second period, we will exploit the method of simultaneously measuring surface and bulk sensitive X-ray magnetic circular dichroism spectra (XMCD) that was developed during the first period. We are aiming for a specific tailoring of the interface properties between Heusler alloy films and the capping layers. We will focus on films consisting of the newly developed Heusler compounds Co2FexMn1-xSi, Co2MnSi1-xAlx, and Co2MnGe, as well as the already studied Co2FeSi and Co2Cr0.6Fe0.4Al films. In addition to the element-specific magnetic moments determined by XMCD, we will measure averaged values for bulk and surface magnetization by using torsion oscillation magnetometry (TOM), which will provide absolute magnetization values. To acquire insight into the spin-orbit coupling, we will relate the out-of-plane magnetic anisotropies measured by TOM to the orbital moment anisotropies. We propose XMCD investigations of selected bulk samples of newly synthesized Heusler alloys that have a constant number of valence electrons, such as Co2FeZ1-xZ’x and Co2YxY’1-xZyZ’1-y (Y,Y’ = Fe, Mn and Z,Z’ = Al, Si, Sn), and of the double perovskites Sr2FexCr1-xReO6, and we will use an in situ cleaving set-up for achieving clean surfaces that are free from defects.
News & Events