Reports 2005
- K. Kroth, G. H. Fecher, J. Morais, C. Felser, G. Schönhense
Imaging of doped semiconductors using X-rays for PEEM and nanoESCA
BESSY Annual Report 2004 (Berlin 2005), 419
- S. Wurmehl, G. H. Fecher, C. Felser, M. C. M. Alves, J. Morais
EXAFS - measurements on Heusler compounds Co2Cr1-xFexAl
LNLS Annual Report 2004, (Campinas, Brazil 2005)
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